Inspecting swath boundaries produced by thermal transfer of organic materials in forming OLED devices
AssigneeEastman Kodak Company
InventorsAndrea S. Rivers, Michael L. Boroson
Life of this patent
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Abstract
A method of inspecting an OLED device to locate and characterize defects in the registration of organic material(s) transferred from a donor in swaths in response to heat produced by a multichannel laser print head includes optically inspecting the OLED device after or during manufacture to identify the boundaries between swaths of transferred organic material(s), and determining if the swaths overlap at a seam of the boundary or if there is a gap between swath edges at the seam or if there is an offset between the edges of adjacent swaths.
Claims7
A method of inspecting an OLED device to determine if organic material(s) transferred from a donor in swaths in response to heat produced by a multichannel laser print head have been produced to minimize visual artifacts produced by the OLED device, comprising:
- a) optically inspecting the OLED device after or during a manufacturing process to identify the boundaries between swaths of transferred organic material(s);
- b) determining if the swaths overlap at a seam of the boundary or determining if there is a gap between swath edges at the seam or if there is an offset between the edges of adjacent swaths;
- and
- c) determining if the overlap, gap or offset are sufficient to require correction in the manufacturing process.
A method of manufacturing an OLED device comprising:
- a) operating a multichannel laser print head in response to an image file to cause the transfer of organic material(s) thermally transferred from a donor in swaths to the OLED device, comprising:
- b) optically inspecting the OLED device after or during a manufacturing process to identify the boundaries between swaths of transferred organic material(s);
- c) determining if the swaths overlap at a seam of the boundary or determining if there is a gap between swath edges at the seam or if there is an offset between the edges of adjacent swaths;
- and
- d) correcting the image file if the overlap, gap or offset are sufficient to require correction in the manufacturing process.
Dependencies are inferred from the claim text.