Testing of samples
AssigneeInstron Corporation
InventorsPaul D. Hayford, David W. Long
Life of this patent
Estimating the term…
Abstract
Test apparatus comprising means for holding a sample to be tested, means for altering the strain in the sample, an optical arrangement for monitoring the sample to be tested, and processing means for processing the signals resulting from the monitoring of the sample under test, wherein the environment between the optical arrangement and the sample under test is controlled, and wherein the sample to be tested is located in a position external to the controlled environment.
Claims7
Test apparatus comprising means for holding a sample to be tested, means for altering the strain in the sample, an optical arrangement for monitoring the sample to be tested, the optical arrangement being spaced from the sample to be tested by a distance, wherein the distance is occupied by a hollow member having air therein, the characteristics of the air being controlled throughout the distance within the hollow member.
Test apparatus comprising means for holding a sample to be tested, means for altering the strain in the sample, an optical arrangement for monitoring the sample to be tested, wherein the optical arrangement is spaced from the holding means by a distance occupied by air, and hollow means for controlling the characteristics of the air throughout the distance.
Dependencies are inferred from the claim text.