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US 7,032,199 B2Granted
Design rule checking integrated circuits
AssigneeMicron Technology, Inc.
InventorsChristophe Chevallier, Adriana Ababei
Life of this patent
Estimating the term…
Abstract
A method of design rule checking an integrated circuit identifies any line having a line width marker and line width parameter, extracts each line having a line width marker, determines the line width parameter for each extracted line, and compares the line width parameter with an actual line width for the line.
Claims19
A method of design rule checking an integrated circuit, comprising:
- identifying any line having a line width marker and a line width parameter;
- extracting each line having a line width marker;
- determining the line width parameter for each extracted line;
- and
- comparing the line width parameter with an actual line width for the line.
2 more elements
A method of design rule checking an integrated circuit, comprising:
- identifying any line having a line width marker and a line width parameter;
- excluding the line if it is near or above a transistor;
- extracting each line having a line width marker;
- determining the line width parameter for each extracted line;
- and
- comparing the line width parameter with an actual line width for the line.
3 more elements
A method of design rule checking an integrated circuit, comprising:
- identifying any line having a line width marker and a line width parameter;
- extracting each line having a line width marker;
- determining the line width parameter for each extracted line;
- comparing the line width parameter with an actual line width for the line;
- and
- excluding from comparing any portion of the line near or above a transistor.
3 more elements
Dependencies are inferred from the claim text.