Method and apparatus for measuring group delay of a device under test

A method of measuring group delay (Tgd) of a device under test, comprising the steps of:

• (a) performing a calibrating operation that includes the sub-steps of
• (a-1) providing an analog input signal having a predetermined period (T),
• (a-2) converting the analog input signal into first and second calibrating digital signals,
• (a-3) detecting a calibrating phase difference between the first and second calibrating digital signals,
• (a-4) generating a calibrating current (I′) corresponding to the calibrating phase difference, and
• (a-5) feeding the calibrating current (I′) to a low-pass filter containing a predetermined resistance (R) to generate a calibrating potential difference (ΔV′);
• (b) performing a measuring operation that includes the sub-steps of
• (b-1) providing the analog input signal to the device under test to generate a delayed output signal from the device under test,
• (b-2) converting the analog input signal and the delayed output signal into first and second digital signals, respectively,
• (b-3) detecting a measuring phase difference between the first and second digital signals,
• (b-4) generating a measuring current (I) corresponding to the measuring phase difference, and
• (b-5) feeding the measuring current (I) to the lowpass filter containing the predetermined resistance (R) to generate a measuring potential difference (ΔV);
• and
• (c) determining the group delay (Tgd) of the device under test according to the predetermined period (T), the measuring current (I), the predetermined resistance (R), and a difference between the calibrating potential difference (ΔV′) and the measuring potential difference (ΔV).

An apparatus for measuring group delay (Tgd) of a device under test that has input and output ends, said apparatus comprising:

• a signal source connected to the input end of the device under test to provide an analog input signal having a predetermined period (T) to the input end of the device under test, thereby enabling the device under test to generate a delayed output signal at the output end thereof;
• a first analog-to-digital converter connected to said signal source for receiving the analog input signal therefrom and for converting the analog input signal into a first digital signal;
• a second analog-to-digital converter connected to the output end of the device under test for receiving the delayed output signal therefrom and for converting the delayed output signal into a second digital signal;
• a phase detector connected to said first and second analog-to-digital converters for receiving the first and second digital signals and for detecting a measuring phase difference between the first and second digital signals;
• a current pump unit connected to said phase detector for generating a measuring current (I) corresponding to the measuring phase difference detected by said phase detector;
• and
• a low-pass filter having a predetermined resistance (R) and connected to said current pump unit, said low-pass filter receiving the measuring current (I) and generating a measuring potential difference (ΔV);
• whereby, the group delay (Tgd) of the device under test is calculated according to the predetermined resistance (R), the predetermined period (T), the measuring current (I), and the measuring potential difference (ΔV).