Position measuring system
AssigneeDr. Johannes Heidenhain GmbH
InventorErich Strasser
Life of this patent
Estimating the term…
Abstract
A method for the functional control of a position measuring system that includes placing a scanning unit at a position with respect to a graduation, generating a first scanning signal and a second scanning signal during the displacing, forming a first measured position value, P1, in accordance with a first linkage rule that involves the first scanning signal and the second scanning signal and forming a second measured position value, P2, in accordance with a second linkage rule that involves the first scanning signal and the second scanning signal, wherein the first linkage rule differs from the second linkage rule. Comparing the first measured position value, P1, with the second measured position value, P2, and generating an error signal as a result of the comparing.
Claims12
A method for the functional control of a position measuring system, comprising:
- placing a scanning unit at a position with respect to a graduation;
- generating a first scanning signal and a second scanning signal when said scanning unit is at said position;
- forming a first measured position value, P1, in accordance with a first linkage rule that involves said first scanning signal and said second scanning signal;
- forming a second measured position value, P2, in accordance with a second linkage rule that involves said first scanning signal and said second scanning signal, wherein said first linkage rule differs from said second linkage rule;
- comparing said first measured position value, P1, with said second measured position value, P2;
- and
- generating an error signal as a result of said comparing.
A method for the functional control of a position measuring system, comprising:
- placing a scanning unit at a position with respect to a graduation;
- generating a first scanning signal and a second scanning signal when said scanning unit is at said position;
- forming a first measured position value, P1, in accordance with a first linkage rule that involves said first scanning signal and said second scanning signal;
- forming a second measured position value, P2, in accordance with a second linkage rule that involves said first scanning signal and said second scanning signal, wherein said first linkage rule differs from said second linkage rule;
- comparing said first measured position value, P1, with said second measured position value, P2;
- and
- generating an error signal as a result of said comparing;
- generating a third scanning signal C=a+cos α;
- and
- generating a fourth scanning signal D=a−cos α;
- wherein said first scanning signal is represented by A=a+sin α and said second scanning signal is represented by B=a−sin α, wherein a is a d.c. component and α is an angular value that ranges from 0° to 360° and is proportional to an instantaneous position within a graduation period of said graduation and said scanning signals A, B, C and D are each of which phased-shifted by 90′ from each other.
A position measuring system, comprising:
- a graduation;
- a scanning unit that is positioned with respect to said graduation, wherein said scanning unit comprises a detector system that generates a first scanning signal and a second scanning signal at an instantaneous relative position between said graduation and said scanning unit;
- an evaluation unit that receives said first scanning signal and said second scanning signal, said evaluation unit forms a first measured position value, P1, based on said first scanning signal and said second scanning signal in accordance with a first linkage rule and a second measured position value, P2, based on said first scanning signal and said second scanning signal in accordance with a second linkage rule, wherein said first linkage rule differs from said second linkage rule;
- and
- a comparator device that receives said first and second measured position values, P1, P2, so as to generate an error signal as a function of said comparator comparing said first and second measured position values, P1, P2.
A position measuring system, comprising:
- a graduation;
- a scanning unit that is positioned with respect to said graduation, wherein said scanning unit comprises a detector system that generates:
- a first scanning signal;
- a second scanning signal at an instantaneous relative position between said graduation and said scanning unit;
- a third scanning signal C=a+cos α;
- a fourth scanning signal D=a−cos α;
- wherein said first scanning signal is represented by A=a+sin α and said second scanning signal is represented by B=a−sin α, wherein a is a d.c. component and α is an angular value that ranges from 0° to 360° and is proportional to an instantaneous position within a graduation period of said graduation and said scanning signals A, B, C and D are each of which phased-shifted by 90′ from each other;
- an evaluation unit that receives said first scanning signal and said second scanning signal, said evaluation unit forms a first measured position value, P1, based on said first scanning signal and said second scanning signal in accordance with a first linkage rule and a second measured position value, P2, based on said first scanning signal and said second scanning signal in accordance with a second linkage rule, wherein said first linkage rule differs from said second linkage rule;
- and
- a comparator device that receives said first and second measured position values, P1, P2, so as to generate an error signal as a function of said comparator comparing said first and second measured position values, P1, P2.
Dependencies are inferred from the claim text.