Apparatus and method for mechanical phase shifting interferometry
AssigneeZygo Corporation
InventorsPeter J. De Groot, Leslie L. Deck
Life of this patent
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AssigneeZygo Corporation
InventorsPeter J. De Groot, Leslie L. Deck
Estimating the term…
An interferometry method including: i) forming an optical interference image by combining different portions of an optical wave front reflected from a pair of surfaces; ii) recording an interference signal at different locations of the optical interference image in response to varying the relative position of the two surfaces over a range of positions; iii) transforming the interference signal for at least one of the locations to produce a spectrum having a peak at a spectral coordinate corresponding to the variation in the relative position of the two surfaces over a range of positions; iv) identifying the spectral coordinate of the peak; and v) for each location, extracting the spectral phase of the interference signal at the coordinate of the peak. For example, the method may further include, for each of the different locations, determining a surface profile of one of the surfaces based on the spectral phase of the interference signal at each of the multiple locations.
An interferometry method comprising:
An interferometry system comprising:
An interferometry method comprising:
An interferometry system comprising:
Dependencies are inferred from the claim text.