Measuring apparatus and measuring chip

A measuring apparatus comprising:

• a plurality of measuring units comprising
• a dielectric block, a thin film layer formed on a surface of said dielectric block, a sensing substance disposed on a surface of said thin film layer so that it interacts with a specific component in a sample, and a sample holding mechanism for holding said sample on a surface of said sensing substance;
• a supporting body for supporting said plurality of measuring units;
• a light source for emitting a light beam;
• an optical incidence system for making said light beam enter said dielectric block at an angle of incidence so that a total internal reflection condition is satisfied at an interface between said dielectric block and said thin film layer;
• photodetection means for measuring the intensity of said light beam totally reflected at said interface;
• and
• a drive means for selectively positioning each measuring unit in either a measuring position where said light beam enters the dielectric blocks thereof, or a standby position where no light enters therein, by relatively moving said support body and said optical system as well as said photodetection means;
• wherein said optical system is constructed so that light beams simultaneously enter the dielectric blocks of at least two measuring units supported by said supporting body;
• and
• wherein said photodetection means comprises at least two photodetectors provided so that they correspond in number to the light beams which enter said dielectric blocks.