Method and apparatus for measuring birefringent particles
AssigneeThe Regentsof the University of California
InventorsJames K. Bishop, Christopher K. Guay
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Abstract
A method and apparatus for measuring birefringent particles is provided comprising a source lamp, a grating, a first polarizer having a first transmission axis, a sample cell and a second polarizer having a second polarization axis. The second polarizer has a second polarization axis that is set to be perpendicular to the first polarization axis, and thereby blocks linearly polarized light with the orientation of the beam of light passing through the first polarizer. The beam of light passing through the second polarizer is measured using a detector.
Claims14
A method of analyzing a birefringent sample characterized by,
- generating a first beam of light using a first polarizer,
- said first polarizer having a first transmission axis,
- contacting a birefringent sample with the first beam of light, thereby creating a second beam of light,
- passing the second beam of light through a second polarizer,
- said second polarizer having a second transmission axis,
- measuring the light passing trough the second polarizer,
- where the first transmission axis is arranged to be perpendicular to the second transmission axis,
- wherein said sample is positioned in a flow-through sample chamber,
- and wherein said birefringent sample comprises a particle.
An apparatus for analyzing a birefringent sample characterized by having a first polarizer having a first transmission axis, and a second polarizer having a second transmission axis,
- said first polarizer and second polarizer arranged such that light emitted from the first polarizer impinges on a sample comprising a particle and is subsequently passed through the second polarizer, where said first transmission axis and said second transmission axis are perpendicular to each other, and wherein said sample is positioned in a flow-through sample chamber.
Dependencies are inferred from the claim text.