System, method, and software for testing electrical devices

Processor-readable software code stored on a processor-readable medium, the code comprising code to:

• instruct an analog-to-digital converter to perform a first analog-to-digital conversion;
• read data associated with the first analog-to-digital conversion;
• instruct the analog-to-digital converter to perform a second analog-to-digital conversion substantially simultaneous to the reading of the data associated with the first analog-to-digital conversion;
• and
• store data in a data structure located within a memory device while the analog-to-digital converter is performing the second analog-to-digital conversion.

A system for performing pipelined analog-to-digital conversions, the system comprising:

• an analog-to-digital converter configured to perform analog-to-digital conversions;
• a processor, the processor being configured to provide instructions to the analog-to-digital converter thereby instructing the analog-to-digital converter to begin an analog-to-digital conversion process, the instructions being provided when data from a previous analog-to-digital conversion is being read by the processor;
• and
• a memory, the memory being configured to store digital values associated with analog signals received at the analog-to-digital converter for further processing.

An apparatus comprising:

• an interface configured to receive signals from a device under test;
• an analog-to-digital converter, the analog-to-digital converter being configured to perform a pipelined analog-to-digital conversion process based on signals received by the analog-to-digital converter;
• a microprocessor, the microprocessor being configured to control the analog-to-digital converter and being configured to determine whether the voltage across the terminals of a device under test meet a predetermined threshold voltage;
• a memory device, the memory device including software to filter noise from the voltage signal received from the device under test.