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US 7,030,640 B2Granted
Integrated circuit (IC) test assembly including phase change material for stabilizing temperature during stress testing of integrated circuits and method thereof
AssigneeMicron Technology, Inc.
InventorsPak Hong Yee, Wuu Yean Tay
Life of this patent
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Abstract
A testing apparatus and method for testing integrated circuits is disclosed wherein a device under test is continuously maintained at a desired set point temperature by an included thermal body. The thermal body has an enclosed phase change material which provides latent heat to the device under test such that there is negligible temperature variation realized by integrated circuits being tested.
Claims12
A testing apparatus for testing integrated circuits, the testing apparatus comprising:
- a test head adapted to receive an integrated circuit under test and having a thermal body portion which includes a phase change material, the thermal body is adapted to provide latent heat from the phase change material to the integrated circuit under test, the test head includes a test assembly having an insert part having a seat for positioning the integrated circuit under test, the insert part having an aperture to allow an electrical connection between electrical contacts of the device under test to controlling circuitry and dedicated processing circuitry, and a pusher part which is moveable between open and closed positions relative to the insert part, the pusher part encloses the thermal body.
A testing apparatus for testing integrated circuits, the testing apparatus comprising:
- a test head adapted to receive an integrated circuit under test, the test head having electrical contacts for making electrical connections to the integrated circuit and a thermal body portion which includes a phase change material, the thermal body is adapted to provide latent heat from the phase change material to the integrated circuit under test;
- controlling circuitry coupled to communicate with the integrated circuit by way of the electrical connections to control functions of the integrated circuit during testing;
- and
- dedicated processing circuitry coupled through a data channel to the integrated circuit by way of the electrical connections to receive output signals from the integrated circuit during testing to determine whether the integrated circuit under test meets predetermined test criteria.
1 more element
Dependencies are inferred from the claim text.