Low pin testing system

A low pin testing system, comprising:

• a housing including at least one receiver opening for removably receiving at least one electrical connector with a plurality of terminals to be tested;
• a plurality of probe passages extending within said housing and into said at least one receiver opening;
• wherein said probe passages are substantially concentrically aligned with a plurality of terminals of at least one electrical connector to be tested;
• at least one light passage extending within said housing and corresponding to at least one row of said probe passages;
• at least one light emitter for providing light through said at least one light passage;
• at least one light receiver for detecting light from said at least one light emitter that passes through said at least one light passage;
• a plurality of testing probes slidably positioned within said plurality of probe passages of said housing in a biased manner towards said at least one receiver opening, wherein each of said testing probes includes an engaging end extending into said receiver opening and for engaging a terminal within said electrical connector;
• wherein said testing probes substantially block light from passing through said at least one light passage when a low pin condition is present and wherein said testing probes substantially allow light to pass through said at least one light passage when a low pin condition is not present;
• wherein said at least one light passage extends substantially transversely through said at least one row of said probe passages;
• wherein said testing probes each include a body portion and at least one cutout within said body portion, wherein said body portion substantially blocks the light through said at least one light passage when a low pin condition is present and wherein said at least one cutout is aligned with said at least one light passage when a terminal is properly seated within an electrical connector being tested;
• wherein said at least one cutout is comprised of a groove substantially surrounding said testing probes;
• and
• a bias member positioned within each of said probe passages for biasing said testing probes forwardly towards said receiver opening.

A method of testing an electrical connector for a low pin condition, said method comprising the steps of:

• positioning an electrical connector having a plurality of terminals within a receiver opening of a testing unit, wherein said testing unit has a plurality of testing probes that are biased and that engage said plurality of terminals within said electrical connector when said electrical connector is positioned within said receiver opening, and wherein said testing probes have a cutout within a body portion;
• illuminating a first end of at least one light passage within said testing unit, wherein said at least one light passage is blocked by said body portion of said testing probes and wherein said cutout allows light to pass by said testing probes;
• and
• detecting if light has passed through said light passage after said positioning of said electrical connector within said receiver opening to determine if a low pin condition is present.

A low pin testing system, comprising:

• a housing including at least one receiver opening for removably receiving at least one electrical connector with a plurality of terminals to be tested;
• a plurality of probe passages extending within said housing and into said at least one receiver opening;
• wherein said probe passages are substantially concentrically aligned with a plurality of terminals of at least one electrical connector to be tested;
• at least one light passage extending within said housing and corresponding to at least one row of said probe passages;
• at least one light emitter for providing light through said at least one light passage;
• at least one light receiver for detecting light from said at least one light emitter that passes through said at least one light passage;
• a plurality of testing probes slidably positioned within said plurality of probe passages of said housing in a biased manner towards said at least one receiver opening, wherein each of said testing probes includes an engaging end extending into said receiver opening and for engaging a terminal within said electrical connector;
• and
• wherein said testing probes substantially allow light to pass through said at least one light passage when a low pin condition is present and wherein said testing probes substantially block light from passing through said at least one light passage when a low pin condition is not present.