Characteristic measuring apparatus for electronic components

An electronic-component characteristic measuring apparatus for measuring an electrical characteristic of a chip-shaped electronic component having first and second external terminal electrodes at first and second opposing ends thereof, the apparatus comprising:

• a holder having at least one receiving cavity for receiving the electronic component, and holding the electronic component with the first and second external terminal electrodes pointing toward first and second opposing open ends of the at least one receiving cavity;
• first and second measuring terminals disposed at the first and second open ends of the at least one receiving cavity so as to come into contact with the first and second external terminal electrodes of the electronic component;
• and
• a shield layer disposed within the holder and having first and second main surfaces, the shield layer including a conductive material and extending between the first and second measuring terminals;
• wherein
• the holder is made of an electrically insulating material;
• and
• both of the first and second main surfaces of the shield layer are sandwiched by the holder, such that the first and second main surfaces of the shield layer are not exposed toward the first and second measuring terminals.