Systems and methods for forming tantalum oxide layers and tantalum precursor compounds
AssigneeMicron Technology, Inc.
InventorsBrian A. Vaartstra, Timothy A. Quick
Life of this patent
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Abstract
A method of forming (and apparatus for forming) a tantalum oxide layer on a substrate, particularly a semiconductor substrate or substrate assembly, using a vapor deposition process and a tantalum precursor compound that includes alkoxide ligands, for example.
Claims31
A method of forming a tantalum oxide layer on a substrate, the method comprising:
- providing a substrate;
- providing a vapor comprising one or more precursor compounds of the formula Ta(OR1)x(O—R2—OR3)y (Formula I), wherein each R is an organic group, x=3-4, and y=1-2;
- providing one or more sources of a reaction gas;
- and
- directing the one or more vaporized precursor compounds and the one or more reaction gases to the substrate to form a tantalum oxide layer on one or more surfaces of the substrate;
- wherein Ta(OR1)x(O—R2—OR3)y is selected from the group consisting of Ta(OEt)4(OCH2CH2OiPr), Ta(OMe)4(OCH2CH2OiPr), and combinations thereof, wherein Me=methyl, Et=ethyl, and iPr=isopropyl;
- wherein providing the vapor comprising the one or more precursor compounds and directing the one or more precursor compounds and the one or more reaction gases is accomplished using an atomic layer deposition process comprising a plurality of deposition cycles.
A method of forming a tantalum oxide layer on a substrate, the method comprising:
- providing a substrate;
- providing a vapor comprising one or more precursor compounds selected from the group consisting of Ta(OEt)4(OCH2CH2OiPr), Ta(OMe)4(OMe)4(OCH2CH2OlPr), and combinations thereof, wherein Me=methyl, Et=ethyl, and iPr=isopropyl;
- and
- directing the one or more vaporized precursor compounds to the substrate to form a tantalum oxide layer on or more surfaces of the substrate;
- wherein providing a vapor comprising the one or more precursor compounds and directing the one more precursor compound is accomplished using an atomic layer deposition process comprising a plurality of deposition cycles.
A method of forming a tantalum oxide layer on a substrate, the method comprising:
- providing a substrate;
- providing a vapor comprising one or more precursor compounds of the formula Ta(OR1)x(O-R2-OR3), wherein each R is an organic group, x=3-4, and y=I-2;
- providing a vapor comprising one or more metal-containing precursor compounds different than Ta(OR1)x(O-R2-OR3)y;
- and
- directing the one or more vaporized precursor compounds of Formula I and the one or more other vaporized precursor compounds to the substrate to form a tantalum oxide layer on one or more surfaces of the substrate;
- wherein Ta(OR1)x(O-R2-OR3)yis selected from the group consisting of Ta(OEt)4(OCH2CH2OiPr), Ta(OMe)4(OCH2CH2OiPr), and combinations thereof, wherein Me=methyl, Et=ethyl, and iPr=isopropyl;
- wherein providing the vapor comprising the one or more precursor compounds of Formula I and the vapor comprising the one or more other precursor compounds;
- and directing the one or more precursor compounds of Formula I and the one or more other precursor compounds is accomplished using an atomic layer deposition process comprising a plurality of deposition cycles.
The method of 22 wherein one or more of the precursor compounds of Formula I and the one or more other precursor compounds are combined in a precursor composition.
The method of forming a tantalum oxide layer on a substrates, the method comprising:
- providing a substrate;
- providing a vapor comprising one or more precursor compounds selected from the group consisting of Ta(OEt)4(OCH2CH2OiPr), Ta(OMe)4(OCH2CH2OiPr), Ta(OMe)4(OCH2CH2OiPr), and combinations therof, wherein Me=methyl, Et=ethyl, and iPr =isopropyl;
- wherein Me =methyl, Et =ethyl, and iPr =isopropyl;
- directing the one or more sources of a reaction gas;
- and gases to the substrate to form a tantalum oxide layer
A method of forming a tantalum oxide layer on a substrate, the method comprising:
- providing a substrate;
- providing a vapor comprising one or more precursor compounds of the formula Ta(OR1)x(O—R2—OR3)y (Formula I), wherein each R is an organic group, x=3-4, and y=1-2;
- providing a vapor comprising one or more metal-containing precursor compounds different than Ta(OR1)x(O—R2—OR3)y;
- and
- directing the one or more vaporized precursor compounds of Formula I and the one or more other vaporized precursor compounds to the substrate to form a tantalum oxide layer on one or more surfaces of the substrate.
- wherein Ta(OR1)x(O—R2—OR3)y is selected from the group consisting of Ta(OEt)4(OCH2CH2OiPr), Ta(OMe)4(OCH2CH2OiPr), and combinations thereof, wherein Me=methyl, Et=ethyl, and iPr=isopropyl;
- wherein providing the vapor comprising the one or more precursor compounds of Formula I and the vapor comprising the one or more other precursor compounds;
- and directing the one or more precursor compounds of Formula I and the one or more other precursor compounds is accomplished using an atomic layer deposition process comprising a plurality of deposition cycles.
Dependencies are inferred from the claim text.