Method of manufacturing a metal-insulator-metal capacitor
AssigneeTexas Instruments Incorporated
InventorsTony Thanh Phan, Farris D. Malone
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Abstract
The present invention provides method of manufacturing a metal-insulator-metal capacitor (100). A method of manufacturing includes depositing a first refractory metal layer (105) over a semiconductor substrate (110). The first refractory metal layer (105) over a capacitor region (200) of the semiconductor substrate (110) is removed and a second refractory metal (300) is deposited over the capacitor region (200). Other aspects of the present invention include a metal-insulator-metal capacitor (900) and a method of manufacturing an integrated circuit (1000).
Claims15
A method of manufacturing a metal-insulator-metal (MIM) capacitor, comprising:
- depositing a first refractory metal layer over a semiconductor substrate having a capacitor region and a transistor region;
- removing said first refractory metal layer over said capacitor region of said semiconductor substrate;
- and
- depositing a second refractory metal layer over said capacitor region.
A method of manufacturing an integrated circuit comprising:
- forming transistors over a semiconductor substrate in a transistor region;
- forming a first refractory metal layer over said transistor region and a capacitor region;
- forming at least one metal insulator metal (MIM) capacitor over said semiconductor substrate in a capacitor region, including:
- removing said first refractory metal layer in said capacitor region;
- depositing a second refractory metal layer over said capacitor region;
- and
- reacting said second refractory metal layer with at least a portion of a silicon layer in said capacitor region to form a silicided refractory metal layer;
- and
- forming interconnections on insulating layers located over said transistor and said MIM capacitor to thereby interconnect said MIM capacitor and said transistors to form an operative active device.
Dependencies are inferred from the claim text.