Ultrasonic agitation-assisted development of resist layer of master stamper/imprinter
AssigneeSeagate Technology LLC
InventorChristopher Formato
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AssigneeSeagate Technology LLC
InventorChristopher Formato
Estimating the term…
A method of forming a topographical pattern in a surface of a resist layer, comprising sequential steps of: (a) providing a substrate having a surface; (b) forming a desired thickness resist material layer on the substrate surface; (c) subjecting selected areas of the surface of the resist layer to exposure to an energy beam to form therein a latent image of a desired topographical pattern to be formed therein; (d) contacting the surface of the resist layer with a liquid developing solution comprising a preselected solvent for developing the latent image into the desired topographical pattern while simultaneously supplying ultrasonic energy thereto, the combination of supplying the ultrasonic energy to the preselected solvent providing an increased developing interval and improved image contrast between the exposed and unexposed areas of the layer of resist material, relative to when the liquid developing solution does not comprise the preselected solvent and the ultrasonic energy is not supplied thereto.
A method of forming a topographical pattern in a surface of a resist layer, comprising sequential steps of:
A method of forming a topographical pattern in a surface of a resist layer, comprising sequential steps of:
A method of forming a topographical pattern in a surface of a resist layer, comprising sequential steps of:
A method of developing a latent image comprised of exposed and unexposed areas formed in a layer of a resist material, comprising contacting said resist layer with a preselected liquid developing solvent while simultaneously supplying ultrasonic energy to said solvent, wherein the combination of supplying said ultrasonic energy to said preselected liquid developing solvent provides an increased developing interval and improved image contrast between said exposed and unexposed areas of said layer of said resist material, relative to when said liquid developing solution does not comprise said preselected solvent and said ultrasonic energy is not supplied thereto.
Dependencies are inferred from the claim text.