Si-containing honeycomb structure and process for production thereof
AssigneeNGK Insulators, Ltd.
InventorsShuichi Ichikawa, Takashi Harada, Aiko Otsuka, Yukihisa Wada, Yoshinori Yamamoto
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AssigneeNGK Insulators, Ltd.
InventorsShuichi Ichikawa, Takashi Harada, Aiko Otsuka, Yukihisa Wada, Yoshinori Yamamoto
Estimating the term…
A honeycomb structure 1 has a large number of through-holes 3 divided by partition walls 2 and extending in the axial direction, characterized in that the honeycomb structure contains a Si phase having a lattice constant controlled at 0.54302 to 0.54311 nm at room temperature. A process for producing the honeycomb structure 1, includes a firing step of firing a precursor of honeycomb structure, wherein the precursor contains a Si phase and the firing step is conducted using a furnace material free from any boron-containing compound. A process for producing the honeycomb structure 1, includes a firing step of firing a precursor of honeycomb structure, wherein a reduction percentage of Si content in Si phase after firing step relative to Si content in Si phase before firing step is suppressed at 10% by mass or less. Having an improved thermal conductivity, the honeycomb structure is superior in thermal shock resistance.
A honeycomb structure having a large number of through-holes divided by partition walls and extending in the axial direction, characterized in that the honeycomb structure contains a Si phase having a lattice constant controlled at 0.54302 to 0.54311 nm at room temperature.
A process for producing a honeycomb structure, which comprises a firing step of firing a precursor of honeycomb structure having a large number of through-holes divided by partition walls and extending in the axial direction, characterized in that the precursor contains a Si phase and the firing step is conducted using a furnace material free from any boron-containing compound.
A process for producing a honeycomb structure, which comprises a firing step of firing a precursor of honeycomb structure having a large number of through-holes divided by partition walls and extending in the axial direction, characterized in that a reduction percentage of Si content in Si phase after firing step relative to Si content in Si phase before firing step is suppressed at 10% by mass or less.
Dependencies are inferred from the claim text.