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US 7,024,335 B1Granted
Condition assessment and life expectancy prediction for devices
AssigneeThe Texas A&M University System
InventorAlexander G. Parlos
Life of this patent
Estimating the term…
Abstract
Assessing the condition of a device includes receiving signals from a sensor that makes electrical measurements of the device. An expected response of the device is estimated in accordance with the received signals, and a measured response of the device is established in accordance with the received signals. An output residual is calculated according to the expected response and the measured response. The condition of the device is assessed by identifying a fault of the device in accordance with the output residual.
Claims38
A method for assessing the condition of a device, comprising:
- receiving a plurality of signals from a sensor operable to make one or more electrical measurements of a device;
- estimating an expected response of the device in accordance with the received signals by:
- estimating a disturbance from the received signals;
- and
- calculating the expected response in accordance with the disturbance;
- establishing a measured response of the device in accordance with the received signals;
- calculating an output residual according to the expected response and the measured response;
- and
- assessing the condition of the device by identifying a fault of the device in accordance with the output residual.
6 more elements
A system for assessing the condition of a device, comprising:
- a sensor operable to make one or more electrical measurements of a device to generate a plurality of signals;
- and
- a processor coupled to the sensor and operable to:
- estimate an expected response of the device in accordance with the signals by:
- estimating a disturbance from the signals;
- and
- calculating the expected response in accordance with the disturbance;
- establish a measured response of the device in accordance with the signals;
- calculate an output residual according to the expected response and the measured response;
- and
- assess the condition of the device by identifying a fault of the device in accordance with the output residual.
8 more elements
Computer-implemented logic for assessing the condition of a device, the logic embodied in a medium and operable to:
- receive a plurality of signals from a sensor operable to make one or more electrical measurements of a device;
- estimate an expected response of the device in accordance with the received signals by:
- estimating a disturbance from the received signals;
- and
- calculating the expected response in accordance with the disturbance;
- establish a measured response of the device in accordance with the received signals;
- calculate an output residual according to the expected response and the measured response;
- and
- assess the condition of the device by identifying a fault of the device in accordance with the output residual.
6 more elements
A system for assessing the condition of a device, comprising:
- means for receiving a plurality of signals from a sensor operable to make one or more electrical measurements of a device;
- means for estimating an expected response of the device in accordance with the received signals by;
- estimating a disturbance from the received signals;
- and
- calculating the expected response in accordance with the disturbance;
- means for establishing a measured response of the device in accordance with the received signals;
- means for calculating an output residual according to the expected response and the measured response;
- and
- means for assessing the condition of the device by identifying a fault of the device in accordance with the output residual.
6 more elements
A method for assessing the condition of a device, comprising:
- monitoring at a sensor one or more electrical measurements of a device to generate a plurality of signals, the device comprising an electric device comprising an electric motor;
- receiving the plurality of signals from the sensor, the received signals comprising one or more measured inputs to the device and one or more measured outputs from the device;
- estimating an expected response of the device in accordance with the received signals by:
- estimating a disturbance of the received signals;
- decoupling a first effect of the one or more measured inputs on the one or more measured outputs and a second effect of the disturbance on the one or more measured outputs;
- and
- estimating the expected response of the device according to the first effect and the second effect;
- establishing a measured response of the device in accordance with the received signals;
- calculating an output residual according to the expected response and the measured response;
- assessing the condition of the device by identifying a fault of the device in accordance with the output residual by:
- extracting a first spatio-temporal feature from the output residual;
- and
- extracting a second spatio-temporal feature from the one or more measurements;
- and
- classifying the fault to assess the condition of the device;
- receiving an indicator corresponding to a life expectancy of the device;
- estimating the life expectancy associated with the device in accordance with the condition of the device and the indicator;
- and
- calculating an uncertainty associated with the estimated life expectancy.
16 more elements
Dependencies are inferred from the claim text.