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US 7,023,556 B2Granted
Method and apparatus for measurement of group delay
AssigneeLucent Technologies Inc.
InventorChristophe J Dorrer
Life of this patent
Estimating the term…
Abstract
A method and apparatus for measuring the group delay of a device are provided. The temporal and spectral intensities of optical pulses are measured after propagation in the device and the group delay of the device is determined using the measured intensities.
Claims22
A method, comprising:
- propagating one or more pulses through a test device and an interferometer;
- measuring the temporal and spectral intensities of one or more pulses propagated through the test device and the interferometer;
- and
- determining the group delay of the test device using the temporal and spectral intensity measurements.
1 more element
An apparatus comprising
- a means of measuring the temporal and spectral intensities of one or more pulses propagated through an interferometer and a test device;
- and
- a means for determining the group delay of the test device using the measured spectral and temporal intensities.
An apparatus comprising:
- an interferometer;
- a temporal intensity analyzer for measuring the temporal intensity of one or more pulses propagated through a test device and the interferometer;
- a spectral intensity analyzer for measuring the spectral intensity of the one or more pulses propagated through the test device and the interferometer;
- and
- a processor for determining the group delay of the test device using the temporal and spectral intensities of the one or more pulses measured by the temporal and spectral analyzers.
2 more elements
An apparatus comprising:
- a means for determining the group delay of a test device from the spectral and temporal intensities of one or more pulses propagated through the test device and interferometer.
Dependencies are inferred from the claim text.