System and method for determining propagation characteristics of photonic structures
AssigneeLucent Technologies Inc.
InventorsSteven E. Golowich, Michael I. Weinstein
Life of this patent
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Abstract
Systems for, and method of, determining propagation characteristics of a photonic structure having a transverse N-fold symmetry. In one embodiment, a system includes: (1) a numerical analyzer that employs a leading order of a systematic homogenization expansion having multiple scales to develop an angularly averaged indexed profile for the photonic structure and (2) a leading order corrector, associated with the numerical analyzer, that further employs the homogenization expansion to refine an imaginary part of an effective index of refraction of the photonic structure.
Claims15
A system for determining propagation characteristics of a photonic structure having a transverse N-fold symmetry, wherein N is an integer greater than zero, comprising:
- a numerical analyzer that employs a leading order systematic homogenization expansion having multiple scales to develop an angularly averaged indexed profile for said photonic structure;
- and
- a principal corrector, associated with said numerical analyzer, that employs details of said photonic structure and said homogenization expansion to obtain effective refractive indices of modes of said photonic structure.
A method of determining propagation characteristics of a photonic structure having a transverse N-fold symmetry, wherein N is an integer greater than zero, comprising:
- employing a leading order systematic homogenization expansion having multiple scales to develop an angularly averaged indexed profile for said photonic structure;
- and
- employing details of said photonic structure and said homogenization expansion to obtain effective refractive indices of modes of said photonic structure.
Dependencies are inferred from the claim text.