Laser distance measuring device with phase delay measurement
AssigneeHilti Aktiengesellschaft
InventorsTorsten Gogolla, Andreas Winter, Helmut Seifert
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AssigneeHilti Aktiengesellschaft
InventorsTorsten Gogolla, Andreas Winter, Helmut Seifert
Estimating the term…
A laser distance measuring device (1) includes a laser diode (4) for emitting a high frequency intensity modulated measurement light beam (3) and connected with a signal generating unit (SGU) that generates a high frequency measurement signal (9) for high frequency signal transfer, at least one receiver photodetector (8a) for receiving a measurement light beam (3) reflected from a measurement object (5) and connected to a high frequency demodulator (13) for generating a low frequency phase delay signal (S1) containing phase information of the reflected intensity modulated measurement light beam (3), and a microcontroller (μC) for calculating a distance (D) from the phase delay signal (S1) and connected to the high frequency demodulator (13), with the microcontroller (μC) being connected to a control photodetector (8c) arranged in the measurement light beam (3) for low frequency transfer for determining an interference modulation component.
A laser distance measuring device, comprising a laser diode (4) for emitting a high frequency, intensity modulated measurement light beam (3);
A distance measuring method, herein in a first step, a low frequency signal is generated, using which in a second step, a high frequency mixer signal (14) and a high frequency measurement signal (9) are produced in such a way that a low frequency mixed product between the high frequency mixer signal (14) and the high frequency measurement signal (9) is phase-locked relative to the low frequency signal generated in the first step, in a third step the high frequency measurement signal (9) is emitted by a laser diode (4) in form of a modulated measurement light beam (3) and is reflected by a measurement object (4) at a distance, in a fourth step, the reflected measurement light beam (3) is received temporally delayed by a receiver photodetector (8a) and the time-offset high frequency measurement signal (9) is demodulated by using a high frequency mixer signal (14), and in a fifth step, a phase delay signal (S1), which is produced by the demodulation of the time-offset high frequency measurement signal (9), is used by a microcontroller (μC) for calculating the distance (D), wherein in the third step at least the low frequency modulation component of the modulated measurement light beam (3) of the laser diode (4) detected using the control photodetector (8c) is presented to the microcontroller (μC) for value determination of an interference modulation component, whereby an error signal transmission is effected by an unmixed control signal connected between said control photodetector and said microcontroller, and contains an error information minimized by error regulation of the modulation.
Dependencies are inferred from the claim text.