Magnetic imaging microscope test system and its application for characterization of read and write heads for magnetic recording

A test method for characterization of read and write heads used for magnetic recording, comprising:

• scanning a work piece using a probe head while contacting engagement is maintained between said probe head and said work piece;
• said probe head having a magnetic device magnetically interacting with said work piece during said scanning;
• producing a time-varying stimulus signal to selectively drive said work piece or said magnetic device at a selected frequency for characterizing said work piece;
• and
• obtaining a readback signal from whichever of said work piece or said magnetic device is not driven by said stimulus signal, said readback signal being induced by said stimulus signal.

A probe head for a magnetic imaging microscope test system for characterization of read and write heads used for magnetic recording, the test system having a scanner assembly, a work piece holder for holding a work piece to be tested, the scanner assembly and the work piece holder being positionable relative to each other, and a probe arm cantilevered from the scanner assembly and extending to a probe arm free end situated adjacent the work piece holder, said probe head comprising:

• a probe head body adapted to mount to said probe arm free end;
• magnetic device means for magnetically interacting with a magnetic field generating or magnetic field sensing work piece;
• a connection for receiving a time-varying stimulus signal that drives said magnetic device means at a selected frequency for characterizing said work piece;
• and
• a connection for providing a readback signal from said magnetic device means, said readback signal being induced by a time-varving stimulus signal applied to said workpiece.