Back to results
US 7,023,198 B2Granted
Semiconductor device and method of inspecting the same
AssigneeRenesas Technology Corp.
InventorsTakeo Miki, Takeshi Hamamoto
Life of this patent
Estimating the term…
Abstract
A semiconductor chip is provided with a phase comparison circuit (1), in addition to an integrated circuit implementing a normal operation. The phase comparison circuit (1) compares phases between an internal signal (A) of the integrated circuit and an external signal and outputs a monitor signal (MONSIG) expressing the result of this comparison outward from the semiconductor chip. Thus, the phase of the internal signal (A) of the integrated circuit can be directly detected.
Claims4
A semiconductor device having M(M≧1) semiconductor substrates, wherein each of said M semiconductor substrates comprises:
- an integrated circuit having a data wire for outputting a data signal,
- a phase comparison circuit comparing phases between an internal signal generated in said integrated circuit and an external signal input from outside said semiconductor device and outputting the result as a monitor signal,
- a first drive circuit outputting said monitor signal to said data wire,
- a second drive circuit outputting said data signal to said data wire,
- said phase comparison circuit compares said phases and said first drive circuit outputs said monitor signal to said data wire when a mode switching signal input from outside said semiconductor device is at a specific value, and
- said second drive circuit outputs said data signal to said data wire when said mode switching signal is not at said specific value.
3 more elements
Dependencies are inferred from the claim text.