Semiconductor device loading apparatus for test handlers
AssigneeSamsung Electronics Co., Ltd.
InventorByung-Gi Jung
Life of this patent
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Abstract
Disclosed herein is a semiconductor device loading apparatus for test handlers. The semiconductor device loading apparatus includes a body. The apparatus body includes a plurality of pickup cylinders provided with a plurality of vacuum adsorbers for vacuum-sucking and transferring semiconductor devices to be tested, a space adjusting plate for adjusting the pitches of the vacuum adsorbers, and an elevation guiding means for guiding the lifting and lowering of the space adjusting plate. A guide block fixing plate is formed to be separate from the body for guiding the semiconductor devices to be accurately positioned in the pockets of a test tray, respectively.
Claims23
A semiconductor device loading apparatus for test handlers, comprising:
- a body including a plurality of pickup cylinders provided with a plurality of vacuum adsorbers to vacuum-suck and to transfer semiconductor devices to be tested, a space adjusting plate to adjust pitches of the vacuum adsorbers, and an elevation guiding unit to guide one of lifting and lowering of the space adjusting plate, wherein said space adjusting plate is provided with a plurality of differently slanted guides formed to individually adjust the pitches of the vacuum adsorbers, with said vacuum adsorbers each interacting with a respective one of the differently slanted guides;
- and
- a guide block fixing plate, separate from the body, to guide the semiconductor devices to be accurately positioned in pockets of a test tray, respectively.
A semiconductor device loading apparatus for test handlers, comprising:
- a body including a plurality of pickup cylinders provided with a plurality of vacuum adsorbers to vacuum-suck and to transfer semiconductor devices to be tested, a space adjusting plate to adjust pitches of the vacuum adsorbers, and an elevation guiding unit to guide one of lifting and lowering of the space adjusting plate;
- and
- a guide block fixing plate, separate from the body, to guide the semiconductor devices to be accurately positioned in pockets of a test tray, respectively,
- wherein said space adjusting plate is provided with a plurality of differently slanted guide slots formed to allow spaces therebetween to be downwardly narrowed so as to adjust the pitches of the vacuum adsorbers, and said vacuum adsorbers are each provided with a guide projection adapted to insert to a respective one of the guide slots.
A semiconductor device loading apparatus for test handlers, comprising:
- a body including a plurality of pickup cylinders provided with a plurality of vacuum adsorbers to vacuum-suck and to transfer semiconductor devices to be tested, a space adjusting plate to adjust pitches of the vacuum adsorbers, and an elevation guiding unit to guide one of lifting and lowering of the space adjusting plate;
- and
- a guide block fixing plate, separate from the body, to guide the semiconductor devices to be accurately positioned in pockets of a test tray, respectively,
- wherein said guide block fixing plate is positioned to be downwardly spaced apart from the vacuum adsorbers and upwardly spaced apart from the test tray, and is provided with guide blocks of a number equal to a number of the pockets of the test tray.
A semiconductor device loading apparatus, comprising:
- a plurality of device loading units to load semiconductor devices;
- a space adjusting unit provided with a plurality of differently slanted guides formed to individually adjust pitches of the device loading units;
- and
- an elevation control unit coupled to the space adjusting unit and controlling an elevation of the space adjusting unit to change a spacing between respective adjacent device loading units in accordance with the elevation of the space adjusting unit by causing the respective adjacent device loading units to interact with a respective one of the differently slanted guides.
A semiconductor device loading apparatus, comprising:
- a plurality of device loading units to load semiconductor devices;
- a space adjusting unit;
- an elevation control unit coupled to the space adjusting unit and controlling an elevation of the space adjusting unit to change a spacing between respective adjacent device loading units in accordance with the elevation of the space adjusting unit;
- and
- a guide block fixing unit provided adjacent to the plurality of device loading units to guide the semiconductor devices therethrough to pockets of a test tray, respectively,
- wherein the guide block fixing unit is remote from the device loading units and the test tray, and is provided with guide blocks of a number equal to a number of the pockets of the test tray, and
- wherein each of the guide blocks is provided with an opening formed therein which is equal in a size thereof to a size of each of the semiconductor devices, and having a pair of guide pins extending toward the test tray from front and rear edges thereof.
A semiconductor device loading apparatus, comprising:
- a plurality of device loading units to load semiconductor devices;
- a space adjusting unit;
- an elevation control unit coupled to the space adjusting unit and controlling an elevation of the space adjusting unit to change a spacing between respective adjacent device loading units in accordance with the elevation of the space adjusting unit;
- and
- a guide block fixing unit provided adjacent to the plurality of device loading units to guide the semiconductor devices therethrough to pockets of a test tray, respectively,
- wherein the guide block fixing unit is remote from the device loading units and the test tray, and is provided with guide blocks of a number equal to a number of the pockets of the test tray, and
- wherein each of the guide blocks comprises an open portion having an entrance portion formed on one surface of the guide block and an exit portion formed on another surface of the guide block such that the entrance portion is larger in a size thereof than a size of the exit portion and a respective semiconductor device is substantially equal in a size thereof to the size of the exit portion to allow the semiconductor device to pass therethrough.
A method of loading a semiconductor device with a loading apparatus for test handlers, comprising:
- adjusting pitches of vacuum adsorbers by one of lifting and lowering of a space adjusting plate, wherein said space adjusting plate is provided with a plurality of differently slanted guides formed to individually adjust the pitches of the vacuum adsorbers, with said vacuum adsorbers each interacting with a respective one of the differently slanted guides;
- vacuum-sucking and transferring the semiconductor devices to be tested to the plurality of vacuum adsorbers;
- and
- guiding the vacuum-sucked and transferred semiconductor devices to be positioned in pockets of a test tray, respectively.
A method of loading semiconductor device, comprising:
- changing a spacing between adjacent device loading units in accordance with an elevation of a space adjusting unit, by controlling an elevation thereof, using a plurality of differently slanted guides, of the space adjusting unit, formed to individually adjust the pitches of the vacuum adsorbers, with said vacuum adsorbers each interacting with a respective one of the differently slanted guides;
- and
- loading the semiconductor devices in accordance with the changed spacing.
A semiconductor device loading apparatus for test handlers, comprising:
- a body including a plurality of pickup cylinders provided with a plurality of vacuum adsorbers to vacuum-suck and to transfer semiconductor devices to be tested, a space adjusting plate to adjust pitches of the vacuum adsorbers, and an elevation guiding unit to guide one of lifting and lowering of the space adjusting plate such that, when the space adjusting plate is lifted or lowered, the pitches of the vacuum absorbers are adjusted;
- and
- a guide block fixing plate formed to be separate from the body to guide the semiconductor devices to be accurately positioned in pockets of a test tray, respectively,
- wherein said space adjusting plate is provided with a plurality of differently slanted guides formed to individually adjust the pitches of the vacuum adsorbers, with said vacuum adsorbers each interacting with a respective one of the differently slanted guides.
Dependencies are inferred from the claim text.