US 7,022,988 B2 · Method and apparatus for measuring physical properties of micro region

Abstract

A method and apparatus for measuring the physical properties of a micro region measures the two-dimensional distribution of stress/strain in real time at high resolution and sensitivity and with a high level of measuring position matching. A sample is scanned and irradiated with a finely focused electron beam (23, 26), and the displacement of position of a diffraction spot (32, 33) is measured by a two-dimensional position-sensitive electron detector (13). The displacement amount is outputted as a voltage value that is then converted into the magnitude of the stress/strain according to the principle of a nano diffraction method, and the magnitude is displayed in synchronism with a sample position signal.

Claims4

Dependent claims

A method of measuring the physical properties of a micro region, comprising the steps of:

detecting the interval or a change in the interval of a pair of diffraction of an electron beam diffraction image spots on a detection plane that are symmetrical with respect to a zero-order diffraction spot, the electron beam diffraction image being formed as a sample is scanned with an electron beam;
and
displaying a signal indicative of the detected interval or change in the interval of the pair of diffraction spots on an image display apparatus in synchronism with electron beam scanning.

An apparatus for measuring the physical properties of a micro region, the apparatus comprising:

a condenser lens system for irradiating a sample with an accelerated electron beam;
an electron beam deflecting means for controlling the position of the irradiation of the sample with the electron beam;
an objective lens for forming an electron beam diffraction image of the sample;
a focusing lens system for magnifying the electron beam diffraction image;
a first and a second two-dimensional electron detector each for detecting a pair of diffraction spots of the electron beam diffraction image magnified by the focusing lens system that are symmetrical with respect to a zero-order diffraction spot and then outputting a signal that is dependent on the detected position of the diffraction spot;
a calculation means for calculating the interval or a change in the interval between the diffraction spot detected by the first two-dimensional electron detector and the diffraction spot detected by the second two-dimensional electron detector;
and
an image display apparatus for displaying a signal indicating the interval or change in the interval of the diffraction spots calculated by the calculation means in synchronism with the scanning of the sample with the electron beam by the electron beam deflection means.

5 more elements

Dependencies are inferred from the claim text.

Facts

Application

10/467,303Filed 28 Feb 2001

Published

US 2004/0061053 A11 Apr 2004

Granted

4 Apr 2006

Term ends

Not estimatedThe source records don’t support an estimate.

Classification15 codes

H01J 37/28
Electron or ion microscopes; Electron or ion diffraction tubes: with scanning beams
G01L 1/241
By measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible…
G01L 5/0047
Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes: measuring forces due to…
G01N 23/20
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 –…: by…

Method and apparatus for measuring physical properties of micro region

Life of this patent

Method and apparatus for measuring physical properties of micro region

Life of this patent

Abstract

Claims4