Substrate mapping
AssigneeMicron Technology, Inc.
InventorsWarren M. Farnworth, Derek J. Gochnour
Life of this patent
Estimating the term…
Abstract
A method for fabricating semiconductor die packages including a mounting substrate and dice attached thereto. The mounting substrate includes multiple die attach sites and a designator having substrate identification information. The die attach sites are evaluated and categorized as either good or defective die attach sites, wherein the evaluated information is saved in an electronic file as mapped information. A die is attached to the die attach sites in accord with the information, wherein known good dice are attached to the good die attach sites and known defective dice are attached to the defective die attach sites. The assembly is then encapsulated in a transfer molding operation.
Claims12
An assembly method for maintaining integrity of a mounting substrate when attaching a semiconductor die thereto, the mounting substrate having a plurality of die attach sites on a surface thereof comprising:
- mapping the plurality of die attach sites on the mounting substrate for determining good die attach sites and defective die attach sites;
- storing information for the good die attach sites and the defective die attach sites of the mounting substrate in an electronic file for access therefrom for accessing information of at least one good die attach site on the mounting substrate and for accessing information for at least one defective die attach site on the mounting substrate;
- attaching at least one semiconductor die to the mounting substrate using the information by one of attaching a known good die to a good die attach site of the good die attach sites using the information for the good die attach sites;
- and
- attaching a known defective die to a defective die attach site of the defective die attach sites using the information of the defective die attach sites.
A method for fabricating semiconductor die packages, each package having a mounting substrate having a plurality of die attach sites on at least one surface thereof, the method comprising:
- evaluating the plurality of die attach sites on the mounting substrate for determining information regarding good die attach sites;
- and for determining defective die attach sites from the information;
- attaching at least one semiconductor die to the mounting substrate according to the information by one of attaching a known good die to a good die attach site of the good die attach sites and attaching a known defective die to a defective die attach site of the defective die attach sites using the information regarding the good die attach sites and the defective die attach sites;
- and
- encapsulating the mounting substrate using an encapsulation material for encapsulating at least one known good die and at least one known defective die on the mounting substrate.
Dependencies are inferred from the claim text.