Method and apparatus for providing excitation for a process controller
AssigneeAdvanced Micro Devices, Inc.
InventorsChristopher A. Bode, J. Broc Stirton, Robert J. Chong
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AssigneeAdvanced Micro Devices, Inc.
InventorsChristopher A. Bode, J. Broc Stirton, Robert J. Chong
Estimating the term…
A method includes defining a design window for a manufacturing process performed by a tool and a process window within the design window. A workpiece likely to have a characteristic outside the process window is identified. The characteristic of the identified workpiece is measured. A control model for controlling the tool is updated using the measured characteristic. A system includes a tool, a process controller, a metrology tool, and a sampling controller. The tool is adapted to process workpieces in accordance with a manufacturing process. The manufacturing process has an associated design window and a process window defined within the design window. The process controller is adapted to control the tool using a control model. The sampling controller is adapted to identify a workpiece likely to have a characteristic outside the process window and direct the metrology tool to measure the characteristic of the identified workpiece. The process controller is further adapted to update the control model using the measured characteristic.
A method, comprising:
A method, comprising:
A system, comprising:
A system, comprising:
A system, comprising:
A system, comprising:
Dependencies are inferred from the claim text.