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US 7,017,431 B2Granted
Methods for inspecting components
AssigneeGeneral Electric Company
InventorsAaron Henry King, James Marion Vau, Brett Wayne Byrnes
Life of this patent
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Abstract
A method for inspecting a component. The method includes coupling the component to a fixture such that the component is fixedly secured in position during machining of the component, and inspecting the component using an inspection tool while the component is coupled to the fixture.
Claims6
A method for inspecting a component, said method comprising:
- coupling the component to a fixture such that the component is fixedly secured in position during machining of the component;
- inspecting the component using an inspection tool while the component is coupled to the fixture, wherein the inspection tool includes a probe having at least a first and a second probe tip;
- positioning the first probe tip relative to the component;
- and
- positioning the second probe tip relative to the component and relative to the first probe tip wherein the first probe tip is slideably coupled to the probe, and the second probe tip is slideably coupled to the probe.
2 more elements
Dependencies are inferred from the claim text.