Obtaining calibration parameters for a three-port device under test
AssigneeAgilent Technologies, Inc.
InventorsKenneth H. Wong, James C. Liu, Johan J. Ericsson
Life of this patent
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AssigneeAgilent Technologies, Inc.
InventorsKenneth H. Wong, James C. Liu, Johan J. Ericsson
Estimating the term…
Calibration is performed for the testing of a device under test. A first port of the device under test is connected to a port of a calibration module. A second port of the device under test is connected to a first port of a device tester. A third port of the device under test is connected to a second port of a device tester. The device tester performs measurements by the device tester to obtain calibration parameters. In response to commands from the device tester, the calibration module changes termination values at the port of the calibration module. The changing of the termination values is performed without physical disconnection of the port of the calibration module from the first port of the device under test.
A method for performing calibration for testing of a device under test, the method comprising:
A device tester that tests a device under test, the device tester comprising:
A device tester that tests a device under test, the device tester comprising:
Dependencies are inferred from the claim text.