Measuring apparatus and measuring method for pattern dependent jitter
AssigneeAnritsu Corporation
InventorsTadanori Nishikobara, Kazuhiko Ishibe
Life of this patent
Estimating the term…
Loading patent…
AssigneeAnritsu Corporation
InventorsTadanori Nishikobara, Kazuhiko Ishibe
Estimating the term…
A clock generating unit generates a clock signal having a predetermined frequency. A pattern generating unit outputs a data signal having a predetermined pattern in which one frame is configured from a predetermined bit length, so as to be synchronized with the clock signal. A waveform information acquiring unit receives the data signal as a data signal to be measured, and receives the clock signal, and acquires information of waveform in the same time domain of the data signal to be measured and the clock signal. An averaging processing unit carries out averaging processing on an acquired waveform. A phase difference detecting unit detects a phase difference of the data signal to be measured and the clock signal, for each bit, based on an averaged waveform information. A frequency band limiting processing unit carries out predetermined frequency band limiting processing on the per-bit phase difference information. A measured result outputting unit outputs the phase difference information as pattern dependent jitter.
A pattern dependent jitter measuring apparatus comprising:
A pattern dependent jitter measuring method comprising:
Dependencies are inferred from the claim text.