Comprehensive erase verification for non-volatile memory
AssigneeSanDisk Corporation
InventorsDat Tran, Kiran Ponnuru, Jian Chen, Jeffrey W. Lutze, Jun Wan
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AssigneeSanDisk Corporation
InventorsDat Tran, Kiran Ponnuru, Jian Chen, Jeffrey W. Lutze, Jun Wan
Estimating the term…
Systems and methods in accordance with various embodiments can provide for comprehensive erase verification and defect detection in non-volatile semiconductor memory. In one embodiment, the results of erasing a group of storage elements is verified using a plurality of test conditions to better detect defective and/or insufficiently erased storage elements of the group. For example, the results of erasing a NAND string can be verified by testing charging of the string in a plurality of directions with the storage elements biased to turn on if in an erased state. If a string of storage elements passes a first test process or operation but fails a second test process or operation, the string can be determined to have failed the erase process and possibly be defective. By testing charging or conduction of the string in a plurality of directions, defects in any transistors of the string that are masked under one set of conditions may be exposed under a second set of bias conditions. For example, a string may pass an erase verification operation but then be read as including one or more programmed storage elements. Such a string can be defective and mapped out of the memory device.
A method of erasing non-volatile memory, comprising:
A memory system, comprising:
A method of operating non-volatile memory, comprising:
A method of erasing non-volatile memory, comprising:
A non-volatile memory system, comprising:
A method of operating non-volatile memory, comprising:
Dependencies are inferred from the claim text.