Circuit and method for reducing leakage current in a row driver circuit in a flash memory during a standby mode of operation
AssigneeMicron Technology, Inc.
InventorTheodore T. Pekny
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AssigneeMicron Technology, Inc.
InventorTheodore T. Pekny
Estimating the term…
A row driver receives an input signal and a test mode signal, and is coupled to first and second voltage sources and has an output coupled to a word line. The row driver operates in an active mode responsive to the test mode signal going inactive to couple the output to either the first or second voltage source responsive to the input signal. The row driver operates in a standby mode responsive to the test mode signal going active to present a high impedance to the word line. A method includes detecting a first mode of operation of a memory device and floating at least some of the word lines when the first mode is detected. The memory device may be a flash memory device and the first mode may be a standby mode of operation of the flash memory device.
A method of operating a memory device including a memory-cell array having a plurality of memory cells arranged in rows and columns, each memory cell in a respective row being coupled to an associated word line having a respective row driver circuit, the method comprising detecting a first mode of operation of the memory device and in response to the first mode of operation, activating pull-down transistors of the row driver circuits and floating at least some sources of the pull-down transistors.
A method of operating a flash memory device during a standby mode of operation, the flash memory device including a memory-cell array having a plurality of memory cells arranged in rows and columns, each memory cell in a respective row being coupled to an associated word line having a respective row driver circuit, the method comprising:
Dependencies are inferred from the claim text.