System and method for removing the relative phase uncertainty in device characterizations performed with a polarimeter

A combined interferometric and polarimetric system for performing measurements on an active device under test comprising:

• a first interferometer arm having a first end and a second end;
• a second interferometer arm having a first end and a second end;
• a tunable laser source for generating a light beam, said tunable laser source being optically coupled to said first end of said first interferometer arm and to said first end of said second interferometer arm;
• a saturation tones generator for generating saturation tones, said saturation tones generator being optically coupled to said first end of said second interferometer arm to receive said saturation tones into said active device under test so that said active device is optically stimulated;
• and
• a polarimeter optically coupled to said second end of said second interferometer arm to receive a second portion of said light beam and selectively optically coupled to said second end of said first interferometer arm to selectively receive a first portion of said light basin, said polarimeter being configured to generate an electrical signal responsive to an intensity signal resulting from the detection of said first portion and said second portion of said light beam when said active device under test is inserted between said first end and said second end of said second interferometer arm.

A method for making combined interferometric and polarimetric measurements on a device under test comprising:

• providing a first interferometer arm having a first end and a second end;
• providing a second interferometer arm having a first end and a second end;
• optically coupling a tunable laser source for generating a light beam to said first end of said first interferometer arm and to said first end of said second interferometer arm;
• and
• optically coupling a polarimeter to said second end of said second interferometer arm to receive a second portion of said light beam and selectively optically coupling said second end of said first interferometer aim to selectively receive a first portion of said light beam, said polarimeter being configured to generate an electrical signal responsive to an intensity signal resulting from the detection of said first portion and said second portion of said light beam when said device under test is inserted between said first end and said second end of said second interferometer arm.

A combined interferometric and polarimetric system for performing measurements on a device under test comprising:

• a tunable laser source for generating a light beam;
• a first optical path optically coupled to said tunable laser source;
• a second optical path optically coupled to said tunable laser source;
• and
• a polarimeter optically coupled to said second optical path to receive a second portion of said light beam and selectively optically coupled to said first optical path to selectively receive a first portion of said light beam, said polarimeter being configured to generate an electrical signal responsive to an intensity signal resulting from the detection of said first portion and said second portion of said light beam when said device under test is optically coupled to said second optical path.

A method for making combined interferometric and polarimetric measurements on a device under test comprising:

• providing a tunable laser source;
• providing a polarimeter;
• providing a first optical path comprising said device under test to optically couple said tunable laser source to said polarimeter;
• and
• selectively providing a second optical path to optically couple said tunable laser source to said polarimeter such that when said second optical path is provided, said polarimeter is enabled to perform an optical interference measurement.

A combined interferometric and polarimetric system for making measurements on a device under test comprising:

• a tunable laser source;
• a polarimeter;
• a first optical path, said first optical path optically coupling said tunable laser source to said polarimeter when said device under test is part of said first optical path;
• and
• a second optical path, said second optical path selectively optically coupling said tunable laser source to said polarimeter such that when said tunable laser source is optically coupled to said polarimeter by said second optical path and that when said device under test is part of said first optical path, said polarimeter is enabled to perform an optical interference measurement.