US 7,009,418 B2 · Inspecting method, semiconductor device, and display apparatus

Abstract

A method for testing a semiconductor substrate forming a liquid crystal display device, which method enables a potential change corresponding to a defective condition of pixel cell driving circuits to be detected accurately even when a ratio of pixel capacitance to wiring capacitance is lowered with decrease in size or increase in definition of the liquid crystal display device. The method includes: a charge retaining step for making pixel capacitances connected to a plurality of pixel switches selected from all pixel switches connected to one data line retain charge; and a detecting step for simultaneously detecting the charge retained in a plurality of the pixel capacitances in the charge retaining step from the one data line.

Claims10

Dependent claims

A testing method for testing a semiconductor substrate, said semiconductor substrate being formed with pixel cell driving circuits arranged in a form of a matrix in correspondence with positions of intersection of data lines and pixel switch control lines, said pixel cell driving circuits each including a pixel switch and a pixel capacitance connected to the pixel switch, for retaining pixel data, said method characterized by comprising:

a charge retaining step for making pixel capacitances connected to a plurality of pixel switches selected from all pixel switches connected to one data line retain charge;
and
a detecting step for simultaneously detecting the charge retained in a plurality of the pixel capacitances in said charge retaining step from said one data line.

A semiconductor device characterized by comprising, on a semiconductor substrate:

pixel cell driving circuits arranged in a form of a matrix in correspondence with positions of intersection of data lines and pixel switch control lines, said pixel cell driving circuits each including a pixel switch and a pixel capacitance connected to the pixel switch, for retaining pixel data;
vertical scanning means for scanning in a vertical direction by sequentially outputting a scanning signal for turning on said pixel switch to said pixel switch control lines, and for testing, generating a testing scanning signal for simultaneously turning on an arbitrary plurality of pixel switches on one of said data lines;
and
horizontal scanning means for scanning in a horizontal direction by applying a data signal to said data lines in predetermined timing.

1 more element

A display apparatus characterized by comprising:

a semiconductor substrate;
a counter substrate having a common electrode and disposed opposite to the semiconductor substrate;
and
a liquid crystal layer interposed between said semiconductor substrate and said counter substrate;
wherein said semiconductor substrate includes:
pixel cell driving circuits arranged in a form of a matrix in correspondence with positions of intersection of data lines and pixel switch control lines, said pixel cell driving circuits each including a pixel switch and a pixel capacitance connected to the pixel switch, for retaining pixel data;
vertical scanning means for scanning in a vertical direction by sequentially outputting a scanning signal for turning on said pixel switch to said pixel switch control lines, and for testing, generating a testing scanning signal for simultaneously turning on an arbitrary plurality of pixel switches on one of said data lines;
and horizontal scanning means for scanning in a horizontal direction by applying a data signal to said data lines in predetermined timing.

5 more elements

Dependencies are inferred from the claim text.

Inspecting method, semiconductor device, and display apparatus

Life of this patent

Inspecting method, semiconductor device, and display apparatus

Life of this patent

Abstract

Claims10