Semiconductor module and methods for functionally testing and configuring a semiconductor module

A semiconductor module, comprising:

• a plurality of contact terminals used for external data interchange, address interchange and/or command interchange during normal operation of the semiconductor module;
• at least one further contact terminal not used for external data interchange, address interchange and/or command interchange during the normal operation of the semiconductor module;
• and
• a main circuit for configuring the semiconductor module, said main circuit connected to said further contact terminal and configured such that a mode of operation for configuring the semiconductor module during the normal operation may be initialized and set through said further contact terminal, it being possible to simultaneously carry out data interchange, address interchange and/or command interchange during the normal operation of the semiconductor module through said contact terminals;
• said main circuit containing:
• a first reception circuit connected to said further contact terminal for receiving and decoding an input code sequence for initializing a test sequence or a configuration sequence;
• and
• a second reception circuit coupled to said further contact terminal for receiving and decoding a function code sequence for setting the test sequence or the configuration sequence, said second reception circuit being released, once the input code sequence has been received and decoded, by said first reception circuit, for the purpose of receiving the function code sequence, it being possible, once the function code sequence has been received and decoded, for said second reception circuit to be used to set a mode of operation for ascertaining and outputting test information and, respectively, for configuring the semiconductor module during the normal operation of the semiconductor module.

A method for functionally testing a semiconductor module having a plurality of contact terminals provided for external data interchange, address interchange and/or command interchange during normal operation of the semiconductor module and at least one further contact terminal not used for external data interchange, address interchange and/or command interchange during the normal operation of the semiconductor module, which comprises the step of:

• initializing and setting a mode of operation for ascertaining and outputting test information during the normal operation of the semiconductor module through the further contact terminal, with data interchange, address interchange and/or command interchange simultaneously being effected during the normal operation of the semiconductor module through the contact terminals;
• performing an input code evaluation by interrogating a state of the further contact terminal, the evaluation being executed until an interrogated input code for initializing a test sequence or a configuration sequence matches a predetermined input code;
• performing a function code evaluation by interrogating a state of the further contact terminal if a result of the input code evaluation is positive, the evaluation being executed until an interrogated function code for setting a test sequence or a configuration sequence matches a predetermined function code;
• and
• subsequently outputting test information during the normal operation of the semiconductor module or configuring the semiconductor module.

A method for configuring a semiconductor module having a plurality of contact terminals used for external data interchange, address interchange and/or command interchange during normal operation of the semiconductor module and at least one further contact terminal not used for external data interchange, address interchange and/or command interchange during the normal operation of the semiconductor module, which comprises the steps of:

• initializing and setting a mode of operation for configuring the semiconductor module during the normal operation of the semiconductor module through the further contact terminal, with data interchange, address interchange and/or command interchange simultaneously being effected during the normal operation of the semiconductor module through the contact terminals;
• performing an input code evaluation by interrogating a state of the further contact terminal, the evaluation being executed until an interrogated input code for initializing a test sequence or a configuration sequence matches a predetermined input code;
• performing a function code evaluation by interrogating the state of the further contact terminal if a result of the input code evaluation is positive, the evaluation being executed until an interrogated function code for setting the test sequence or the configuration sequence matches a predetermined function code;
• and
• subsequently outputting test information during the normal operation of the semiconductor module or configuring the semiconductor module.