Photodiode structure and image pixel structure
AssigneeMicron Technology, Inc.
InventorsInna Patrick, Vladimir Berezin
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Abstract
A CMOS imager with two adjacent pixel active area regions without the presence of an intervening trench isolation region that typically separates two adjacent pixels and their associated photodiodes is provided. The shared active area region isolates the two adjacent photodiodes and provides good substrate to surface pinned layer contact without the presence of n− type dopant ions and due to the presence of p-type dopant ions. As a result, the size of the imager can be reduced and the photodiodes of the two adjacent pixels have increased capacitance.
Claims33
A photodiode structure comprising:
- a first photodiode comprising a first doped region of a first conductivity in contact with a second doped region of a second conductivity;
- and
- a second photodiode comprising the first doped region of the first conductivity in contact with a third doped region of the second conductivity;
- wherein said first and second photodiodes share the first doped region.
A photodiode structure, comprising:
- a first photodiode comprising a first conductivity type region formed in a substrate;
- and
- a charge collection region of a second conductivity type that accumulates photogenerated charge;
- wherein said first photodiode shares said first conductivity type region with a second photodiode, and the first and second photodiodes are partially separated by a region of a second conductivity type.
An image pixel structure comprising at least two adjacent image pixel cells, said adjacent image pixel cells comprising:
- a first trench isolation region formed in a semiconductor substrate;
- a first pixel adjacent said first trench isolation region, said first pixel comprising a first photodiode comprising a first doped region of a first conductivity in contact with a second doped region of a second conductivity;
- a second pixel adjacent said first pixel, said second pixel comprising a second photodiode comprising a first doped region of the first conductivity in contact with a second doped region of the second conductivity, wherein said first and second photodiodes share a common doped region of a first conductivity type and are separated by the second doped regions of the second conductivity type;
- and
- a second trench isolation region formed in said semiconductor substrate, said second trench isolation region formed adjacent to said second pixel.
A CMOS imaging device comprising a plurality of image pixel cells, wherein at least two image pixel cells are adjacent to each other and comprise:
- a first field isolation region formed in a semiconductor substrate;
- a first pixel adjacent said field isolation region, said first pixel comprising a first photodiode adjacent to a second photodiode from a second pixel, said first and second photodiodes sharing a common active region;
- and
- a second field isolation region formed in said semiconductor substrate, said second field isolation region adjacent to said second pixel.
A imager system comprising:
- (i) a processor;
- and
- (ii) an imaging device coupled to said processor, said imaging device comprising at least two image pixel cells with pinned photodiode structures, said photodiode structures comprising:
- a first photodiode comprising a first doped region of a first conductivity in contact with a second doped region of a second conductivity;
- and
- a second photodiode comprising a first doped region of a first conductivity in contact with a second doped region of a second conductivity, wherein said first and second photodiodes share a common active region.
Dependencies are inferred from the claim text.