Semiconductor member manufacturing method and semiconductor device manufacturing method
AssigneeCanon Kabushiki Kaisha
InventorsKazuya Notsu, Nobuhiko Sato
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AssigneeCanon Kabushiki Kaisha
InventorsKazuya Notsu, Nobuhiko Sato
Estimating the term…
This invention provides an SOI substrate manufacturing method using a transfer method (bonding and separation). A separation layer (12) is formed on a silicon substrate (11). A silicon layer (13), SiGe layer (14), silicon layer (15′), and insulating layer (21) are sequentially formed on the resultant structure to prepare a first substrate (10′). This first substrate (10′) is bonded to a second substrate (30). The bonded substrate stack is separated into two parts at the separation layer (12). Next, Ge in the SiGe layer (14) is diffused into the silicon layer (13) by hydrogen annealing. With this process, a strained SOI substrate having the SiGe layer on the insulating layer (21) and a strained silicon layer on the SiGe layer is obtained.
A semiconductor substrate comprising:
Dependencies are inferred from the claim text.