Card for testing functions of card interface
AssigneeHigh Tech Computer, Corp.
InventorsJen-De Chen, Yung-Ming Lu
Life of this patent
Estimating the term…
Loading patent…
AssigneeHigh Tech Computer, Corp.
InventorsJen-De Chen, Yung-Ming Lu
Estimating the term…
A card for testing functions of the card interface of an electronic device is provided. The testing card includes a converting circuit, a latch circuit, a data processor, a signal generator, an oscillation combination circuit, and a reset circuit is provided. The converting circuit is coupled to the card interface. The latch circuit receives the data signal fed in from the card interface, latches the data signal and outputs it to the data processor afterwards. Having received the signal sent from the converting circuit and the latch circuit, the data processor is able to proceed with testing. The signal generator can output the mode selection signal and the interrupt signal to the card interface to test the functions of mode selection and interrupt signals. Furthermore, the oscillation combination circuit can generate a wait signal and feed the wait signal to the card interface for the wait test.
A testing card for coupling to a card interface installed in an electronic device to test functions of the card interface, wherein the card interface complies with an interface specification, the testing card comprising:
A testing system, coupled to a card interface installed in an electronic device to test a function of the card interface, wherein the card interface complies with an interface specification, the testing system comprising:
Dependencies are inferred from the claim text.