Waveguide-based optical interferometer

An apparatus for measuring spatial locations, the apparatus comprising:

• a first object at a first location;
• a second object at a second location;
• a waveguide-based interferometer coupled between the first object and the second object;
• wherein
• the waveguide-based interferometer comprising a waveguide material, the waveguide material being adapted to carry at least a reference beam at a reference frequency and a corresponding reference wavelength and a measurement beam at a measurement frequency and a corresponding measurement wavelength;
• the reference frequency is different from the measurement frequency;
• the reference beam traverses a first path defined within the waveguide material;
• the measurement beam traverses a second path defined within the waveguide material and a third path defined outside of the waveguide material, the third path related to at least one of the first location and the second location.

An apparatus for measuring spatial locations, the apparatus comprising:

• a first object at a first location;
• a second object at a second location;
• a waveguide-based interferometer coupled between the first object and the second object;
• wherein
• the waveguide-based interferometer comprising a waveguide material, the waveguide material being adapted to carry at least a first reference beam at a first frequency and a corresponding first wavelength, a second reference beam at a second frequency and a corresponding second wavelength, a first measurement beam at the first frequency and the corresponding first wavelength, and a second measurement beam at the second frequency and the corresponding wavelength;
• the first frequency is different from the second frequency;
• the first reference beam traverses a first reference path defined within the waveguide material;
• the second reference beam traverses a second reference path defined within the waveguide material;
• the first measurement beam traverses a first measurement path defined within the waveguide material and an external path defined outside of the waveguide material, the external path related to at least one of the first location and the second location;
• the second measurement beam traverses a second measurement path defined within the waveguide material;
• the first measurement path and the first reference path have a first common end;
• the second measurement path and the second reference path have a second common end.

An apparatus for measuring spatial locations, the apparatus comprising:

• a first object at a first location;
• a second object at a second location;
• a waveguide-based interferometer coupled between the first object and the second object;
• wherein
• the waveguide-based interferometer comprising a waveguide material, the waveguide material being adapted to carry at least a first reference beam at a first frequency and a corresponding first wavelength, a second reference beam at a second frequency and a corresponding second wavelength, a first measurement beam at the first frequency and the corresponding first wavelength, and a second measurement beam at the second frequency and the corresponding wavelength;
• the first frequency is different from the second frequency;
• the first reference beam traverses a first reference path defined within the waveguide material;
• the second reference beam traverses a second reference path defined within the waveguide material;
• the first measurement beam traverses a first measurement path defined within the waveguide material and a first external path defined outside of the waveguide material, the first external path related to the first location;
• the second measurement beam traverses a second measurement path defined within the waveguide material and a second external path defined outside of the waveguide material, the second external path related to the second location;
• the first measurement path and the first reference path have a first common end;
• the second measurement path and the second reference path have a second common end.

An apparatus for measuring spatial locations, the apparatus comprising:

• a first object at a first location;
• a waveguide-based interferometer coupled to the first object;
• wherein
• the waveguide-based interferometer comprising a waveguide material, the waveguide material being adapted to carry at least a first beam and a second beam;
• the first beam traverses a first path defined within the waveguide material;
• the second beam traverses a second path defined within the waveguide material and a third path defined outside of the waveguide material, the third path related to the first location.