Asynchronous pseudo SRAM and access method therefor
AssigneeKabushiki Kaisha Toshiba
InventorsYoshiaki Takeuchi, Kohei Oikawa
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AssigneeKabushiki Kaisha Toshiba
InventorsYoshiaki Takeuchi, Kohei Oikawa
Estimating the term…
A semiconductor integrated circuit device includes an address buffer which receives an address signal that indicates an address of a memory cell array, a latch circuit which latches the data, and an address transition detection circuit which detects transition of the address. During the access operation of the memory cell array, an address at the operation start time is latched by the latch circuit. After the end of the operation of the memory cell array, an address that is currently input to the address buffer is latched by the latch circuit. If the received address signal is data different from the latch data, a control signal that controls the cycle operation of the memory cell array for a predetermined period is generated on the basis of the detection result from the address transition detection circuit.
A semiconductor integrated circuit device comprising:
A semiconductor integrated circuit device comprising:
An access method for a semiconductor integrated circuit device including a memory cell array, an address buffer which receives an address signal that indicates an address of the memory cell array, a latch circuit which latches the address output from the address buffer, an address transition detection circuit which detects transition of the address, and a control circuit which comprises a timeout circuit that controls a cycle operation of the memory cell array on the basis of a detection result from the address transition detection circuit, comprising:
An access method for a semiconductor integrated circuit device including a memory cell array, a row address buffer which receives a row address signal that indicates a row address of the memory cell array, a column address buffer which receives a column address signal that indicates a column address of the memory cell array, a CE buffer which receives an external chip enable signal, a WE buffer which receives an external write enable signal, a first row address latch which latches the row address signal output from the row address buffer, a second row address latch which latches the row address signal output from the first row address latch and outputs an internal row address signal, a first column address latch which latches the column address signal output from the column address buffer, a second column address latch which latches the column address signal output from the first column address latch and outputs an internal column address signal, a row address transition detection circuit which detects transition of the row address signal output from the first row address latch, a column address transition detection circuit which detects transition of the column address signal output from the first column address latch, a chip enable transition detection circuit which detects transition of the external chip enable signal output from the CE buffer, a write enable transition detection circuit which detects transition of the external write enable signal output from the WE buffer, an ATD AND circuit which ANDs detection results from the row address transition detection circuit, the column address transition detection circuit, the chip enable transition detection circuit, and the write enable transition detection circuit, and an internal CE control circuit which comprises a timeout circuit that controls a cycle operation of the memory cell array, controls a row system circuit and a column system circuit to access the memory cell array, and also controls the row address buffer, the column address buffer, the first and second row address latches, and the first and second column address latches on the basis of an AND signal output from the ATD AND circuit, comprising:
Dependencies are inferred from the claim text.