On-die switchable test circuit
AssigneeDell Products L.P.
InventorsLarry W. Finn, Leonard E. Mohrmann
Life of this patent
Estimating the term…
Abstract
An information handling system includes a computer system having at least one integrated circuit formed on a die. The integrated circuit includes an output circuit and a device pin operably connected with the output circuit. A load resistor (or other type of load or termination component) and a test switch for selectively connecting the load resistor to the output circuit are also formed on the die. In one aspect, the load resistor is selected to correspond with a representative system load.
Claims19
An information handling system comprising:
- a computer system having at least one integrated circuit formed on a die, the integrated circuit comprising:
- an output circuit comprising a PCI bus output buffer;
- a device pin operably connected with the output circuit, the device pin operable to be accessed by a test probe associated with an oscilloscope;
- a load resistor formed on the die;
- a test switch for selectively connecting the load resistor to the output circuit.
An apparatus formed on a die, the apparatus comprising:
- an output circuit comprising a PCI bus output buffer;
- a device pin operably connected with the output circuit, the device pin operable to be accessed by a test probe associated with an oscilloscope;
- a load resistor formed on the die;
- a test switch for selectively connecting the load resistor to the output circuit.
The apparatus of claim 16 wherein the load resistor corresponds to a selected system load.
A method of testing an integrated circuit output circuit for use in an information handling system comprising:
- selecting a resistive load corresponding to a predicted system load;
- forming an output circuit on the die, the output circuit comprising a PCI bus output buffer;
- forming a load resistor on the die proximate the switch;
- supplying power to the output circuit;
- connecting the load resistor and the output circuitry;
- and
- measuring the output circuit response at a device pin operably connected with the output circuit, the device pin operable to be accessed by a test probe associated with an oscilloscope.
Dependencies are inferred from the claim text.