Method and apparatus for measuring waveforms and wavelengths of optical signals
AssigneeAgilent Technologies, Inc.
InventorYasuhisa Kaneko
Life of this patent
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Abstract
A method and apparatus for measuring characteristics of a single-wavelength optical signal constituting part of a wavelength division multiplexed (WDM) optical signal is provided. The WDM optical signal is adjustably diffracted to select the single-wavelength optical signal. An optical-to-electrical conversion is performed. An electrical sampling signal representing the selected single-wavelength optical signal is generated by one of (a) optically sampling the selected single-wavelength optical signal to generate an optical sampling signal on which the optical-to-electrical conversion is performed, and (b) electrically sampling an electrical signal generated by performing the optical-to-electrical conversion on the selected single-wavelength optical signal.
Claims20
A method for measuring characteristics of a single-wavelength optical signal constituting part of a wavelength division multiplexed (WDM) optical signal, the method comprising:
- adjustably diffracting the WDM optical signal to select the single-wavelength optical signal;
- performing an optical-to-electrical conversion;
- and
- generating an electrical sampling signal representing the selected single-wavelength optical signal, the generating comprising one of (a) optically sampling the selected single-wavelength optical signal to generate an optical sampling signal on which the optical-to-electrical conversion is performed, and (b) electrically sampling an electrical signal generated by performing the optical-to-electrical conversion on the selected single-wavelength optical signal.
A method for measuring characteristics of a single-wavelength optical signal constituting part of a wavelength division multiplexed (WDM) optical signal, the method comprising:
- angularly adjustably diffracting the WDM optical signal to select the single-wavelength optical signal and provide angle data related thereto;
- deriving wavelength information from the angle data;
- performing an optical-to-electrical conversion;
- generating an electrical sampling signal representing the selected single-wavelength optical signal, the generating comprising one of (a) optically sampling the selected single-wavelength optical signal to generate an optical sampling signal on which the optical-to-electrical conversion is performed, and (b) electrically sampling an electrical signal generated by performing the optical-to-electrical conversion on the selected single-wavelength optical signal;
- and
- storing the wavelength information and the electrical sampling signal.
Apparatus for measuring characteristics of a single-wavelength optical signal constituting part of a wavelength division multiplexed (WDM) optical signal, comprising:
- a wavelength selector that adjustably diffracts the WDM optical signal to select the single-wavelength optical signal;
- and
- a sampling optical-to-electrical converter that generates an electrical sampling signal representing the selected single-wavelength optical signal by one of (a) optically sampling the selected single-wavelength optical signal to generate an optical sampling signal on which an optical-to-electrical conversion is performed, and (b) electrically sampling an electrical signal generated by performing an optical-to-electrical conversion on the selected single-wavelength optical signal.
Apparatus for measuring characteristics of a single-wavelength optical signal constituting part of a wavelength division multiplexed (WDM) optical signal, comprising:
- an angularly adjustable wavelength selector that adjustably diffracts the WDM optical signal to select the single-wavelength optical signal and provide angle data related thereto;
- circuitry for deriving wavelength information from the angle data;
- a sampling optical-to-electrical converter that generates an electrical sampling signal representing the selected single-wavelength optical signal by one of (a) optically sampling the selected single-wavelength optical signal to generate an optical sampling signal on which an optical-to-electrical conversion is performed, and (b) electrically sampling an electrical signal generated by performing an optical-to-electrical conversion on the selected single-wavelength optical signal;
- and
- a memory for storing the wavelength information and the electrical sampling signal.
Dependencies are inferred from the claim text.