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US 7,002,358 B2Granted
Method and apparatus for measuring jitter
AssigneeHewlett-Packard Development Company, L.P.
InventorPerry M. Wyatt
Life of this patent
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Abstract
A method of measuring jitter includes generating a jitter pulse having a width corresponding to an amount of jitter. The jitter pulse is provided to a plurality (M) of latches serially coupled to successively trim the pulse as it propagates through the serially coupled latches. Each latch, li, provides an output bi indicative of receipt of an edge of the jitter pulse.
Claims19
A method of measuring jitter, comprising:
- generating a jitter pulse having a width corresponding to an amount of jitter;
- and
- providing the jitter pulse to a first latch of a plurality (M) of latches serially coupled to successively trim the pulse as it propagates through the serially coupled latches, wherein each latch, li, provides an output bi indicative of receipt of an edge of the jitter pulse.
A jitter measurement apparatus comprising:
- a phase/frequency detector apparatus providing a jitter pulse having a pulse width corresponding to an amount of jitter in a clock signal;
- and
- a plurality (M) of serially coupled latches at least one receiving the jitter pulse, wherein each latch li propagates a trimmed pulse having a shorter pulse width than its received pulse, wherein each latch li provides an output bi indicative of receipt of an edge of any pulse received by that latch.
Dependencies are inferred from the claim text.