Jitter measuring apparatus and a testing apparatus

A testing apparatus for testing an electronic device comprising:

• a pattern generating unit for generating a test pattern for testing the electronic device;
• a pattern formatting unit for formatting the test pattern and providing the electronic device with it;
• a jitter measuring apparatus for analyzing jitter of an output signal output by the electronic device according to the test pattern;
• and
• a determining device for determining pass/fail of the electronic device on the basis of the analysis result of the jitter measuring apparatus, wherein
• said jitter measuring apparatus comprises
• a multi-strobe generating unit for generating multi-strobe having more than or equal to three (3) strobes a plurality of times synchronously with the output signal output a plurality of times by the electronic device,
• a value detecting unit for detecting a value of the output signal for each strobe of the multi-strobe generated a plurality of times by said multi-strobe generating unit,
• a transition point detecting unit for detecting the position of a transition point of the value of each output signal on the basis of the value of the output signal detected by said value detecting unit, and
• a histogram generating unit for counting how many times said transition point detecting unit detects the transition point at every position of the transition point of the value of the output signal.