Semiconductor integrated circuit device and method of testing the same

A semiconductor integrated circuit device comprising:

• a semiconductor substrate of a first conductive type;
• a first well of a second conductive type provided in the semiconductor substrate;
• a second well of the first conductive type provided in the first well;
• a third well of the second conductive type provided in the semiconductor substrate;
• a fourth well of the first conductive type provided in the third well;
• semiconductor elements provided in the first and second wells, the semiconductor elements constructing a first functional integrated circuit;
• semiconductor elements provided in the third and fourth wells, the semiconductor elements constructing a second functional integrated circuit;
• a first internal power source voltage generating circuit provided in the first well, the first internal power source voltage generating circuit configured to generate a first internal power source voltage being applied to the first functional integrated circuit;
• a second internal power source voltage generating circuit provided in the third well, the second internal power source voltage generating circuit configured to generate a second internal power source voltage being applied to the second functional integrated circuit;
• a fifth well of the second conductive type provided in the first well;
• and
• a sixth well of the second conductive type provided in the third well, wherein the first functional integrated circuit comprises semiconductor elements provided in the fifth well, and the second functional integrated circuit comprises semiconductor elements provided in the sixth well.