Charged-particle beam writer

A charged-particle beam writer which draws a pattern on a specimen with a charged-particle beam generated from a single particle generator by both of a VSB (variable-shaped beam) strategy and a scan-projection strategy, the charged-particle beam writer comprising:

• a data creating unit configured to create pattern data by combining first figure data and decompressed second figure data, said pattern data representing a state where a first figure defined by the first figure data and drawn by the VSB strategy and a second figure defined by the second figure data and drawn by the scan-projection strategy are arranged on the specimen;
• a computing unit configured to calculate, on the basis of the pattern data, the amount of correction for correcting the drawing dimensions of the first figure on the specimen and the drawing dimensions of the second figure on the specimen;
• and
• a control unit configured to control the dose of beam at each position on the specimen on the basis of the calculated amount of correction.