X-ray imaging device
AssigneeHamamatsu Photonics K.K.
InventorsEmi Miyata, Kazuhisa Miyaguchi
Life of this patent
Estimating the term…
Abstract
The X-ray imaging device comprises an imaging portion having sensitivity to X-ray with a predetermined energy range and to visible light with a predetermined wavelength range and picking up images of X-ray and visible light and a scintillator to emit visible light with predetermined wavelength range by absorbing X-ray with a higher energy range than a predetermined energy range. The imaging portion is arranged corresponding to a surface of X-ray incidence. The scintillator is formed on an opposite surface to the surface of X-ray incidence across the imaging portion in a direction of X-ray incidence.
Claims12
An X-ray imaging device, comprising:
- an imaging portion arranged corresponding to a surface of X-ray incidence, having sensitivity to X-ray with a predetermined energy range and to visible light with a predetermined wavelength range and picking up images of X-ray and visible light;
- and
- a scintillator arranged on an opposite surface to said surface of X-ray incidence across said imaging portion in a direction of X-ray incidence, emitting visible light with said predetermined wavelength range by absorbing X-ray with a higher energy range than said predetermined energy range.
An X-ray imaging device, comprising:
- an imaging portion formed on an opposite surface to a surface of X-ray incidence on a semiconductor substrate, having sensitivity to X-ray with a predetermined energy range and to visible light with a predetermined wavelength range and picking up images of X-ray and visible light;
- and
- a scintillator arranged on the opposite surface of said semiconductor substrate so as to cover said imaging portion, emitting visible light with said predetermined wavelength range by absorbing X-ray with a higher energy range than said energy range.
An X-ray imaging device, comprising:
- an imaging portion formed on a surface of X-ray incidence on a semiconductor substrate, having sensitivity to X-ray with a predetermined energy range and to visible light with a predetermined wavelength range and picking up images of said X-ray and said visible light;
- and
- a scintillator arranged on an opposite surface to said surface of X-ray incidence on said semiconductor substrate so as to cover at least an area corresponding to said imaging portion, emitting visible light with said predetermined wavelength range by absorbing X-ray with a higher energy range than said-predetermined energy range.
Dependencies are inferred from the claim text.