Exposure method, exposure apparatus, and method of production of device
AssigneeNikon Corporation
InventorNobuyuki Irie
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AssigneeNikon Corporation
InventorNobuyuki Irie
Estimating the term…
An exposure method for preventing accumulation of process error for substrates processed by an apparatus designed for multiprocessing and producing high quality semiconductor chips. A semiconductor integrated circuit production line polishes wafers of individual lots at a first processing system and second processing system of a CMP system two at a time. Wafer processing information indicating at which processing system of the first processing system and second processing system each wafer has been processed is transmitted through a communication line to a later processing apparatus including an exposure apparatus. The wafers of a lot loaded in the exposure apparatus are allocated to a plurality of processing systems of the exposure apparatus so that wafers processed by the same processing system are processed by the same processing system among the two processing systems of the exposure apparatus and are exposed at those processing systems.
A exposure method for exposing a sensitive substrate by an exposure apparatus having a plurality of processing systems to transfer a pattern on a mask to said sensitive substrate, wherein:
An exposure method for successively exposing a plurality of sensitive substrates by an exposure apparatus having a first substrate stage and a second substrate stage, the exposure method comprising:
An exposure method for successively exposing a plurality of sensitive substrates by an exposure apparatus having a first substrate stage, a second substrate stage, and a common optical system that exposes sensitive substrates loaded on the first substrate stage when the first substrate stage is disposed at an exposure position and that exposes sensitive substrates loaded on the second substrate stage when the second substrate stage is disposed at the exposure position, the exposure method comprising:
Dependencies are inferred from the claim text.