Method for detecting the end point by using matrix
AssigneeWinbond Electronics Corp.
InventorSzetsen Steven Lee
Life of this patent
Estimating the term…
Abstract
A method for detecting the end point of plasma etching process by using matrix comprises a step of detecting a beginning matrix including emitting intensities and/or other plasma parameters of at least two different plasma species during beginning etching process. Then, a step of detecting an etching matrix is performed in which the etching matrix includes emitting intensities and/or other plasma parameters of the at least two different plasma species at the etching reaction. An end point matrix is then computed by using the beginning as well as etching matrices and compared to a reference end point matrix to decide whether the end point is reached.
Claims14
A method for detecting an end point comprising steps of:
- providing a reference end point matrix in a plasma process;
- detecting an illuminant intensities of at least two kinds of plasma species within different wavelengths at the beginning of said plasma process, and combining said illuminant intensities of at least two kinds of plasma species within different wavelengths for the elements of an initial matrix;
- detecting said illuminant intensities of at least two kinds of plasma species corresponding to different wavelengths during said plasma process, and combining said illuminant intensities of said two kinds of plasma species within different wavelengths for the elements of a processing matrix;
- calculating said initial matrix and said processing matrix to get an end point matrix, and said initial matrix times said end point matrix being said processing matrix;
- and
- detecting said end point of said plasma process by comparing said end point matrix with a reference end point matrix.
A method for detecting an end point comprising steps of:
- detecting a first matrix at the beginning of a test plasma process, said first matrix having plasma parameters of at least two kinds of plasma species within different wavelengths before etching;
- detecting a second matrix at the end of said plasma process, and corresponding to said first matrix, said second matrix having said plasma parameters of said two kinds of plasma species within different wavelengths;
- getting a reference end point matrix by calculating said first matrix and said second matrix, and said first matrix times said reference end point matrix being said second matrix;
- during a plasma process, detecting plasma parameters of at least two kinds of plasma species within different wavelengths at the beginning of etching, and combining said plasma parameters of said two kinds of plasma species for elements of an initial matrix;
- detecting said two kinds of plasma parameters of plasma species within different wavelengths during the progress of said plasma process, and corresponding to said initial matrix, combining said plasma parameters of said two kinds of plasma species within different wavelengths for a process matrix;
- calculating said initial matrix and said process matrix to get an end point matrix, and said initial matrix times said end point matrix being said process matrix;
- and
- comparing said end point matrix with said reference end point matrix to detect said end point of said plasma process.
Dependencies are inferred from the claim text.