Apparatus and method for controlling the temperature of an electronic device under test

An apparatus for controlling the temperature of an electronic device under test, said apparatus comprising:

• a refrigeration system including a compressor and a condenser, said refrigeration system being operative to circulate a refrigerant fluid through a fluid flow loop such that said refrigerant fluid will change between gaseous and liquid states so as to alternately absorb and release thermal energy;
• a thermal head having a temperature controlled surface, said thermal head defining a flow channel for passage of said refrigerant fluid to thereby function as an evaporator in said refrigeration system;
• and
• a metering valve located operatively adjacent said evaporator in said fluid flow loop, said metering valve being operative to regulate introduction of said refrigerant fluid into said flow channel of said thermal head for maintaining a predetermined temperature at said temperature controlled surface.

An apparatus for controlling the temperature of an electronic device under test, said apparatus comprising:

• a refrigeration system including a compressor and a condenser, said refrigeration system being operative to circulate a refrigerant fluid through a fluid flow loop such that said refrigerant fluid will change between gaseous and liquid states so as to alternately absorb and release thermal energy;
• a thermal head having a temperature controlled surface configured to be in thermal contact with said electronic device under test, said thermal head defining a flow channel for passage of said refrigerant fluid to thereby function as an evaporator in said refrigeration system;
• and
• a metering valve located within 18 inches of said evaporator in said fluid flow loop, said metering valve being operative to regulate introduction of said refrigerant fluid into said flow channel of said thermal head for maintaining a predetermined temperature at said temperature controlled surface.