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AssigneeArizona Board of Regents
InventorsRodolfo E. Diaz, Ampere A. Tseng, Karl S. Booksh, Jose Menendez, Sethuraman Panchanathan, Michael Wagner
Estimating the term…
Methods and apparatus for gathering image information from nanostructures includes a composite waveguide of conductive nanoparticles in a dielectric medium. The waveguide is irradiated with preferably coherent blue light to form a slow surface wave. The evanescent wave that is the “tail” of the surface wave exists outside the waveguide contiguous to its surface. The nanostructures are located to encounter the evanescent wave. The slowing of the wave that occurs in the waveguide reduces the wave's speed and wavelength sufficiently such that nanostructures can be imaged. Upon encountering the evanescent wave, the nanostructures radiate. This radiation causes a backward scattering from the structures and a forward perturbation of the wavefront of the surface wave. From the scattering and perturbation information about the physical characteristics of the nanostructures sufficient to form an image is derived.
A method of gathering information concerning nanostructure characteristics including:
A method of gathering information concerning nanostructure characteristics including:
A method of gathering information concerning nanostructure characteristics including:
A method of gathering information concerning nanostructure characteristics including:
A method of gathering information concerning nanostructure characteristics including:
A method of gathering information concerning nanostructure characteristics including:
A structure examination transducer including an electromagnetic illumination pattern detector comprising an array of fluorescent particles, at least a plurality of the particles differing in fluorescent characteristic to emit light of different wavelengths upon fluorescing, means for directing electromagnetic illumination from a structure under examination to the array and means for directing to the array a reference electromagnetic illumination having a frequency causing interfering cancellation and reinforcing enhancement of the illumination from the structure whereby the frequencies of fluorescent emissions from the array are indicative of characteristics of the structure.
In a transducer for examining nanostructures by irradiating with electromagnetic energy;
A nanostructure examination transducer including:
A method of displaying characteristics of an object comprising:
Dependencies are inferred from the claim text.